Design Fault Tolerant Full Adder Using Fault Localization

Molhim, Mohammed and Nabil Akabati, Razan and Abbas, Zahraa and Rahim Aoaid, Azhar (2024) Design Fault Tolerant Full Adder Using Fault Localization. In: 5TH INTERNATIONAL CONFERENCE ON COMMUNICATION ENGINEERING AND COMPUTER SCIENCE (CIC-COCOS'24), 24-25/04/2024, Cihan University-Erbil.

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Abstract

Many reasons lead to errors in digital circuits. some of these errors are often transient (including electromagnetic fields, cosmic radiation, and noise) and others permanent (a result of poor manufacturing, and storage). in two cases they leave a negative impact on the operation of these circuits. The size of these circuits is too small compared with their function and accuracy. these circuits are very sensitive to such errors, whether they are transient or permanent. The impact of transient errors on these circuits can be catastrophic in high-performance computing systems, where multiple processing units are used. Due to the importance of the Full Adder as a basic structure in building processors, a small-size fault-tolerant Full Adder is proposed in this paper. The proposed Full Adder possesses a high ability to detect and repair errors. The proposed design has a high reliability during work in real-time compared with previous designs.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Digital circuits;Transient errors;Permanent errors;Electromagnetic fields;Cosmic radiation
Subjects: Q Science > QA Mathematics > QA76 Computer software
Divisions: Conferences > CIC-COCOS
Depositing User: ePrints Depositor
Date Deposited: 13 Apr 2025 17:37
Last Modified: 13 Apr 2025 17:37
URI: https://eprints.cihanuniversity.edu.iq/id/eprint/3077

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